Spark spectrometry (spark OES) works by igniting the plasma created by a high-energy spark discharged in an argon atmosphere between the sample and the counter-electrode. Measuring the light emitted during this process enables simultaneous quantitative analysis of all required chemical elements in less than 30 seconds. It is thus possible to detect all metals, semimetals as well as a number of non-metals like, for instance, carbon, phosphorous, sulphur, oxygen or nitrogen. With that, spark spectrometry constitutes an outstanding quality control process for the metal producing and processing industry. Spark spectrometry is suitable for production control and R&D purposes just as for incoming materials control and utilising secondary raw materials containing iron, nickel, cobalt, aluminium, copper, magnesium, zinc, lead, titanium…
OBLF Spark Spectrometers
Our spectrometer models differ with regard to the number of matrices and elements that need to be determined. All of our systems are characterised by excellent long-term stability (vacuum optics), low operating costs (patented spark stand with minimised argon consumption) and low maintenance needs (e.g. automated purging of the spark stand). The number of analysis channels our systems provide is specially tailored to suit customer requirements. Each device is separately calibrated using certified reference materials.
The MVS 1000 is suitable for versatile analytical requirements such as multi matrix applications. The cost-efficient device always detects the complete emission spectrum by means of sensor lines. A high number of element channels and extensions are easy to implement.
This compact spectrometer analyzed all relevant elements for one metallic matrix. As detectors photomultiplier tubes are used.
The VeOS is suitable for versatile analytical requirements such as multi matrix applications. The device always detects the complete emission spectrum by means of sensor lines. A high number of element channels and extensions are easy to implement.
The QSG 750-II uses the same optical system as the QSN 750-II, but is equipped with GISS technology. This means
a. the lowest possible detection limits and
b. the possibility of inclusion analysis.